Learning Acyclic Probabilistic Circuits Using Test Paths
Dana Angluin and James Aspnes and Jiang Chen and David Eisenstat and Lev Reyzin

Learning Acyclic Probabilistic Circuits Using Test Paths.pdf261.89kB
Type: Paper
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Bibtex:
@article{10:65,author={Dana Angluin and James Aspnes and Jiang Chen and David Eisenstat and Lev Reyzin}, Title={Learning Acyclic Probabilistic Circuits Using Test Paths},journal={Journal of Machine Learning Research},volume={10}, url={http://www.jmlr.org/papers/volume10/angluin09a/angluin09a.pdf}}


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