Learning Acyclic Probabilistic Circuits Using Test Paths
Dana Angluin and James Aspnes and Jiang Chen and David Eisenstat and Lev Reyzin

@article{10:65,author={Dana Angluin and James Aspnes and Jiang Chen and David Eisenstat and Lev Reyzin}, Title={Learning Acyclic Probabilistic Circuits Using Test Paths},journal={Journal of Machine Learning Research},volume={10}, url={http://www.jmlr.org/papers/volume10/angluin09a/angluin09a.pdf}}